Application of EDS and EELS in Analytical TEM
Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS) are powerful analytical techniques that are routinely used for semi-quantitative elemental analysis of a wide range of materials. When paired with Transmission Electron Microscope (TEM), they provide nanometer-level or even atomic-level direct observations into materials elemental distribution, which shine numerous applications in increasingly complex 3D structures in emerging techniques such as IOT, facial recognition, 5G communications, etc. In this webinar we will introduce the basics of TEM-based EDS and EELS, their respective benefits and limits, and cover a series of application case studies. A reverse engineering materials analysis report of a smartphone will also be discussed.
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About the Presenter:
Xiangyu Xia, Ph.D., Project Manager
Dr. Xiangyu Xia is a Project Manager at Nanolab Technologies, Eurofins Materials Science, which he joined as a materials scientist in 2016. He obtained a BS in Materials Science and Engineering from Shanghai Jiaotong university and PhD in Materials Science from University of Wisconsin-Madison. At Nanolab, Xiangyu specializes in utilizing TEM, FIB and APT to solve complex materials analysis questions for a wide range of industrial clients.
In this webinar we will cover:
- Basics of EDS, EELS and analytical TEM
- Reverse engineering of a smartphone
- materials analysis study of 7 nm FINFET technique and 92 layer 3D NAND
- Applications of EELS in advanced materials analysis
- Introduction of Nanolab TEM capabilities