SMART Chart Webinar Series: AFM & OP

View a recording of this seminar

Presented: Wednesday, April 15, 2020

SMARTchart_AFM-OPLet's take a deeper dive into our SMART Chart!

Unlike many of the analytical techniques at EAG, Atomic Force Microscopy (AFM) and Optical Profilometry (OP) do not measure chemical composition. Instead, they provide 3D images of surfaces that show topography and texture and can determine roughness statistics and critical dimensions. Characterizing surface roughness is of importance because it can impact the performance and function, appearance, and tactility of a material. In addition, AFM can deliver much more than standard topography imaging. Using specialized probes and sensors, it is possible to map various electrical and physical properties (e.g. dopant distribution or modulus variations). When used together, OP and AFM can reveal the most complete picture of a surface’s topography, from the macro-scale (such as shape and bow) down to the nano-scale.

Please view all of our webinars here.

About the Presenter:

sara-ostrowski2Sara G Ostrowski, Ph.D., Surface Properties Manager
Sara Ostrowski has over ten years of experience with AFM and OP for a wide array of material types and applications. Sara has a Ph.D. in Analytical Chemistry from Penn State University where she studied phospholipid distribution in biological cell membranes using chemical imaging. She worked for five years at General Electric’s Global Research Center supporting R&D efforts with materials characterization. She is celebrating ten years at EAG.

This webinar will introduce you to AFM, advanced AFM-based techniques, and OP, with a brief overview of the theory of each technique and representative examples of them in action.

In this webinar we will cover:

  • Principles of operation
  • Sample requirements
  • Practical examples
  • Common uses and interesting examples
  • Strengths and limitations