SMART Chart Webinar Series: APT
Atom Probe Tomography (APT)
Presented: Thursday, July 23, 2020
Let's take a deeper dive into our SMART Chart!
Atom Probe Tomography (APT) is a new material analysis technique that provides three-dimensional (3D) chemical and spatial maps at the atomic scale. APT is unique in its ability to obtain chemical distributions across grain boundaries, heterojunctions, thin films and buried interfaces for metallic systems, ceramics, semiconductors and oxides. Identifying the location and concentration of chemical species is important as they directly affect performance and longevity. APT also enables 3D analysis of low atomic number (Z) elements such as H, B and Li which cannot be carried out with other advanced analytical techniques such as STEM-EDS (scanning transmission electron microscopy- energy dispersive x-ray spectroscopy) and SIMS (secondary ion mass spectrometry).
Nanolab Technologies (a Eurofins Company), provides the world’s first and only commercial APT analysis that can cover a wide range of applications across industries such as semiconductors, energy generation and optical lighting.
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About the Presenter:
Pritesh Parikh, Ph.D., Scientist, Atom Probe Engineering
Dr. Pritesh Parikh joined Nanolab Technologies (a Eurofins Company), in 2020 as a Scientist for atom probe engineering. He obtained a BS in Electrical Engineering and a MS in Physics from BITS Pilani, India and a PhD in NanoEngineering from the University of California, San Diego. With 4 years of experience in materials analysis for finFETs, perovskites solar cells and lithium-ion batteries, at Nanolab, Pritesh specializes in utilizing Dualbeam/FIB and APT to solve complex material challenges for various client projects.
In this webinar we will cover:
- Operating principles
- Unique capabilities and limitations
- Sample preparation and analysis
- Representative examples