SMART Chart Webinar Series: EBSD
Electron Backscatter Diffraction (EBSD)
Presented: Thursday, May 28, 2020
Let's take a deeper dive into our SMART Chart!
This webinar will focus on Electron Backscatter Diffraction (EBSD).
EBSD is a rapidly developing technique in the material characterization field. The technique gives microstructure information in the meso-scale which includes grain size, crystal orientation, grain boundaries, dislocations, and phase identification that all contribute to the device performance and reliability.
Typical components that benefit from the EBSD analysis includes bond pads, solder joints, thin wires and capacitors.
Electron channeling contrast imaging (ECCI) is a derivative technique from EBSD that gives quantitively defect density measurement of single crystals. The scanning area is on the order of several tens to hundreds of micrometers making this measurement ideal for high quality crystals (defect density 108/cm2 to 105/cm2).
Please view all of our webinars here.
About the Presenter:
Jingyi Zhang, Ph.D., EBSD Scientist
Dr. Jingyi Zhang is an EBSD Scientist at EAG Laboratories, which she joined in 2018 after completing a doctorate in Mechanical Engineering at Washington State University. Her thesis was on mechanical and microstructural characterization of friction welds of dissimilar aluminum alloys.
Previously she had earned an MS in Materials Science and Engineering at Iowa State University, and a BS in Materials Science at Tianjin University.
In this webinar we will demonstrate how we turn problems into solutions by presenting:
- Sample Requirement
- Case Study
- Data Analysis
- Derivative Technique: ECCI