SMART Chart Webinar Series: SEM-EDS
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Let's take a deeper dive into our SMART Chart!
Energy Dispersive X-ray Spectroscopy (EDS) is a powerful analytical technique that is routinely used for semi-quantitative elemental analysis of a wide range of materials. Routinely paired with Scanning Electron Microscopy (SEM) it provides an indispensable first-look technique during a Failure Analysis. With its relatively fast data acquisition, exceptional spot size and near-complete coverage of the periodic table EDS provides broad applicability to a whole range of materials. But when is EDS not enough? In this iteration of the SMART Chart webinar series we will introduce the principles of the technique and provide examples to highlight the capabilities of the technique but also discuss its limitations.
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About the Presenter:
John Moskito, Expert in Materials Science
John is an expert in materials characterization. In his career he has specialized in the application and interpretation of near surface analytical techniques including Auger Electron Spectroscopy (AES), X-Ray Photoelectron Spectroscopy (XPS - ESCA), Secondary Electron Microscopy (SEM - EDX), Time Of Flight SIMS (ToF-SIMS), Transmission Electron Microscopy (TEM - STEM), Focus Ion Beam (FIB) and many others.
Coupled with a strong background in materials engineering, failure analysis and metallurgy, he has created, developed and delivered unique analytical solutions to a broad set of industries and technologies including medical devices, semiconductor, thin films, and opto-electronics.
In this webinar we will cover:
- Principles of the technique
- Common uses
- Sample requirements
- Strengths and limitations