SMART Chart Webinar Series: TOF-SIMS
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
View a recording of this seminar
Presented: Wednesday, May 6, 2020
Let's take a deeper dive into our SMART Chart!
Our upcoming webinar in this series will be focused on TOF-SIMS (Time of Flight Secondary Ion Mass Spectrometry).
TOF-SIMS is a surface analysis technique which is used to investigate the extreme surfaces of samples, where it can provide information about elemental, inorganic and organic species that are present. This information can be used to compare surface treatments, identify contaminants, and determine the root cause of surface related problems. When combined with cluster ion sputtering, the resulting depth profiles can show variations in chemical composition with respect to depth.
Please view all of our webinars here.
About the Presenter:
Ian A. Mowat, Ph.D., Vice President, Materials Characterization
Ian Mowat joined EAG (then Charles Evans & Associates) in 1996 as a TOF-SIMS Scientist, after getting his Ph.D. in Chemistry from the University of Edinburgh. He worked in the TOF-SIMS group for many years and later spent time in SIMS, FTIR and sales & marketing. In 2015 he took over as VP for Materials Characterization and has responsibility for a wide range of analytical services provided in Sunnyvale, Minneapolis, Princeton and Eindhoven.
This webinar will expand and sharpen your technical knowledge about TOF-SIMS as you learn more about this highly flexible technique.
In this webinar we will cover:
- Principles of operations
- Sample requirements
- Real-world examples
- Mass Spectra
- Depth profiling
- Strengths and limitations of the technique
We will also discuss complementary techniques and the relationship between TOF-SIMS and other surface mass spectrometry techniques.