SMART Chart Webinar Series: XPS
View a recording of this seminar
Presented: Wednesday, April 1, 2020
Let's take a deeper dive into our SMART Chart! Our first webinar in this series will be focused on X-Ray Photoelectron Spectroscopy (XPS).
XPS is a surface analysis technique which is used to determine quantitative atomic composition and chemistry. This information can be used to compare surface treatments, identify stains and residues, and determine the root cause of adhesion problems. When combined with energetic ion sputtering, the resulting depth profiles can measure the composition of thin films as a function of depth.
Please view all of our webinars here.
About the Presenter:
Monica Neuburger, Ph.D., Manager, Surface Science
Monica Neuburger has over 15 years of experience in surface chemistry and materials characterization. Her areas of expertise include XPS and TOF-SIMS and as Manager of EAG’s Surface Science group she oversees projects from a wide range of industry sectors. She is passionate about helping clients find solutions to challenges involving R&D, production monitoring and failures.
This webinar will expand and sharpen your technical knowledge about XPS as you learn a new approach to problem-solving and failure analysis.
In this webinar we will cover:
- Principles of operations
- Sample requirements
- Real-world examples
- Contaminant identification
- Oxide thickness
- Angle-resolved XPS
- Composition with depth
- Strengths and limitations of the technique.