SMART Chart Webinar Series: XRD & XRR
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Let's take a deeper dive into our SMART Chart!
X-ray Diffraction (XRD) is a common analytical technique for the comprehensive examination of the structure of crystalline materials; in other words, scanning a material’s fingerprint. Often used for identifying and quantifying material phases and investigating crystallinity, this robust technique is capable of so much more. X-ray Reflectivity (XRR) is a complementary technique commonly used for the characterization of thin film materials, providing thin film layer thicknesses, densities, and roughness values. Both of these techniques stand on their own as essential tools in an engineer’s toolkit, but when used together or in conjunction with supplementary techniques, provide a holistic approach to real-world problem-solving.
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About the Presenter:
Ian J. McDonald, Ph.D., Scientist
Ian McDonald has a strong background in materials characterization with over 10 years of experience in X-ray Scattering. At EAG, Ian specializes in XRD, XRR, and XRF working in a wide range of industry sectors. Above all else, he values clear communication with clients working toward reliable and timely solutions with a goal-oriented methodology.
The aim of this webinar is to introduce you to the fundamental principles of XRD and XRR with a focus on practical examples that illustrate the power of this technique on its own and as a supplement for other techniques.
In this webinar we will cover:
- Principles of operation
- Sample requirements
- Practical examples
- Common uses and interesting cases
- Multi-technique work
- Strengths and limitations